News

Today we are machining some metal inside the scanning electron microscope! By creating a custom fixture, we can manually ...
Feedback notes the flurry of new papers mentioning the mysterious "vegetative electron microscope", and ponders the emergence ...
for operating all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning electron microscopes (FIB-SEMs). Universal software designed to operate any ZEISS light or ...
ZEISS announces the introduction of its highly flexible and efficient software suite, ZEN core, for operating all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning ...
According to a market report by Lucintel, the future of the global electron microscopy market looks promising with ...
A new deep learning method called DLE-EM accelerates SEM imaging of geological materials by up to 16×, enabling large-scale, ...
for operating all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning electron microscopes (FIB-SEMs). ZEN stands for ZEISS Efficient Navigation and lets microscopists ...
Czech-based electron microscope manufacturer TESCAN is undergoing a strategic shift, expanding into advanced semiconductor ...
A digital investigation reveals how AI can latch on to technical terminology, despite it being complete nonsense.