A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid ...

As the probe scans across the surface ... including the integration of SPM techniques with other microscopy and spectroscopy methods, the development of high-speed scanning probes for dynamic studies, ...

Three powerful options are available with Bruker for performing electrochemical (EC) scanning probe microscopy: Electrochemical Scanning Tunneling Microscopy (ECSTM), Electrochemical Atomic Force ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

By adapting their quantum twisting microscope to operate at cryogenic temperatures, researchers have made the first ...

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Atoms are so small they cannot be seen using a regular microscope. Scientists have discovered a way to “see” atoms using a special instrument called a scanning probe microscope (SPM). A probe with a ...

Scanning Tunneling Microscopy is a subset of Scanning Probe Microscopy (SPM), a group of techniques that image and manipulate surfaces at the nanometer to atomic scales. SPM techniques share the ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Innova atomic force microscope from ...

A member of the Core Research Facilities, the Microscopy Core Laboratory (MCL) offers a variety of micro-imaging and micro-analysis solutions by providing access to several photon-, scanned probe-, ...

The Electron and Scanning Probe Microscopy Unit provides solutions for imaging and analysis at the nanoscale. The unit houses two scanning electron microscopes, two scanning probe microscopes and ...