Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization ... driven by advancements in probe technology, instrumentation, and data analysis techniques. Some key areas of ...

A new study shows how plasma-assisted inert gas ion bombardment improves the nanoscale texture of cobalt thin films, enhancing performance in data storage applications.

Researchers at Nano Life Science Institute (WPI-NanoLSI), Kanazawa University and colleagues have achieved a breakthrough in understanding sperm DNA packaging. Using high-speed atomic force microscopy ...