The Perkin Elmer PHI-660 scanning Auger microprobe can be used for the compositional analysis of specimen surfaces using Auger electron spectroscopy (AES). The probe depth of AES is on the order of ...

Feedback notes the flurry of new papers mentioning the mysterious "vegetative electron microscope", and ponders the emergence ...

I used to have access to some pretty nice Scanning Electron Microscopes (a SEM ... EDS (Energy-dispersive X-ray spectroscopy) and Auger spectrometry come to mind. Another interesting use is ...

Principles of surface analytical techniques, including Auger electron spectroscopy, photoemission, low energy electron diffraction, energy loss spectroscopy and scanning probe microscopy. Surface ...

The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including ...