Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

The atomic force microscopy research facility at the DLR Institute of Engineering Thermodynamics in Oldenburg enables the nanoscale surface analysis of components for fuel cell and electrolysis ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Our project focuses on analyzing how proteins assemble on membranes using Atomic Force Microscopy. With high-resolution, fast-scan Atomic Force Microscopy, we will directly visualize the structure and ...